Used KLA / TENCOR P11 #293662985 for sale

KLA / TENCOR P11 is a wafer testing and metrology equipment designed for high-volume yield analysis and fab process monitoring. The system utilizes advanced imaging analysis techniques to inspect wafers, with the aim of ensuring minimal defect levels. It is equipped with tool-specific optical and metrology components optimized for imaging, characterization and defect review. With its 2X optical and 6X metrology systems, KLA P-11 is a powerful and versatile tool for a variety of wafer inspection applications. TENCOR P 11 features a robust and rigid gantry structure designed to support large site density. Its highly reliable imaging systems are capable of providing rapid, defect-free wafer inspection at a cycle time of approximately 15 seconds. With its enhanced imaging systems, KLA / TENCOR P-11 utilizes advanced algorithms to detect subtle defects which may not be detected by traditional systems. Additionally, TENCOR P-11 offers advanced overlay, patterned masking, and flicker imaging capability for optimized defect detection. P-11 also incorporates several advanced metrology components, including a proprietary AFM (Atomic Force Microscopy) unit with ultra-high lateral registration to measure wafer topology with an unmatched level of accuracy. KLA / TENCOR P 11's high-performance metrology machine is further enhanced by its patented Multi-Layer Contour Analysis technology for highly accurate critical dimension (CD) measurement. Finally, P11 includes an automated defect review station which utilizes advanced 3D defect recognition algorithms to assist in the review and post-processing of wafer inspection data. Overall, TENCOR P11 is a powerful and versatile wafer testing and metrology tool which is packed with advanced imaging analysis techniques, metrology components, and automated defect review capabilities. It is highly reliable, delivering accurate and rapid inspection results at a cycle time of 15 seconds. With its ability to detect subtle defects, measure wafer topology with unmatched accuracy, and automate defect review, P 11 is an ideal tool for achieving high production yields and accurate process monitoring in the semiconductor industry.