Used KLA / TENCOR P11 #293753932 for sale

KLA / TENCOR P11 is a wafer testing and metrology equipment designed to provide reliable and high-throughput testing and diagnosis of wafers. This system is capable of testing and diagnosing various wafer formats such as Si, SOI, GaN, and GaAs. This unit is used to verify circuit performance of manufacturing samples, detect defects and analyze yield issues. KLA P-11 machine is equipped with wafer handling based on the Automated Wafer Mapping (AWM) methodology. This automated mapping tool allows the operator to place an entire wafer array in as few as 8 seconds moving from one wafer slot to the next without any manual intervention. This asset also provides improved accuracy with precise wafer placement and automated focus compensation for imaging 3D features. The model is equipped with sharp optics, high-speed sensors, and precise laser-based metrology systems for assessing comprehensive defect data. This equipment is designed for high production yield testing, providing rapid, reliable and accurate defect inspection, analysis, and characterization. The optical microscope design and enhanced illumination systems used by the system provides greater clarity and detail of wafer defects at a higher resolution. In addition to its wafer testing capabilities, TENCOR P 11 unit includes advanced software tools to analyze and trend data. It also includes a defect review station that allows the operator to review defect maps and images, allowing them to quickly identify, characterize and prioritize defects. KLA P 11 wafer testing and metrology machine is an ideal solution for cost effective and reliable testing and diagnosing of wafers at high speeds while ensuring high process yields and reliable results. Its automated mapping tool, precise laser-based metrology systems, advanced software tools and defect review station offers the highest reliability and performance for all your wafer testing and metrology needs.