Used KLA / TENCOR P11 #293821170 for sale

KLA / TENCOR P11 is a wafer testing and metrology system designed to deliver powerful analytical capabilities for the most demanding semiconductor processes and lithography requirements. It is the industry leader in both testing and metrology, and has been lauded for its superior performance and reliability. KLA P-11 utilizes multiple integrated technologies for comprehensive wafer testing and characterization. Its patented Inspection Signature Verification (ISV) capability identifies and differentiates complex defect signatures, enabling more accurate and reproducible process characterization and control. TENCOR P 11's Advanced Scanning Optical Profiling (ASOP) enables accurate, real-time measurement of wafers down to the nanometer level - starting at the wafer level but with the ability to drill down to the transistor level. Other high-performance features include capability for automated defect review, inspection and fault isolation in multiple failure modes, and integration of up to 16 test systems with a common failure database. In addition, TENCOR P11 offers high-speed testing and parametric measurements for standard DUTs (devices under test) as well as complex test structures, and its advanced metrology technology yields up to 6 metrology values per die. Its modular architecture makes set up, configuration and diagnostics easy, while upgrades are fast and simple. KLA / TENCOR P 11 is an excellent choice for applications that require powerful wafer testing and metrology. Its advanced technologies and capabilities enable fast and reliable characterization of wafers and devices, while its intuitive and modular design reduces setup time and maintenance costs.