Used KLA / TENCOR P11 #9009149 for sale
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ID: 9009149
Profilometer
Microhead sr Green probe tip (2um radius, 60 degrees)
3.1 Windows operating system
Tencor software version 2.0 (including 2.1, 2.2 and 2.3 upgrades).
KLA / TENCOR P11 is a high-performance wafer testing and metrology equipment designed specifically for semiconductor applications. It is an integrated system designed to quickly measure and analyze semiconductor wafers in a single unit. It is equipped with a wide range of high-precision probe cards and autofocus laser interferometers to provide the highest level of performance available. This machine offers high throughput, high accuracy, and reliability to meet the most demanding semiconductor industry requirements. KLA P-11 tool is powered by dual-core processors and large memory systems. It is equipped with a 14-axis positioning asset to enable rapid and accurate measurement of many different types of 2D patterns. An automated computer-controlled feature recognition model provides ultra-fast signal recognition, allowing TENCOR P 11 to collect more data and make more accurate measurements. An integrated mapping equipment allows for high level topographical data acquisition and analysis. The system has an integrated autofocus laser interferometer which uses a wavelength-stabilized 910nm excimer laser for ultra-precise measurement of semiconductor wafers and devices. P 11 has a fully automated stage which can move the probes to any point on the wafer's surface in milliseconds. The stage has a wide range of motion, including a sweeping motion for quickly locating features over a large area. The unit has a powerful defect-detection engine capable of analyzing standard images and 3D data. This machine can detect and measure defects based on their shape, edges, gray levels and other parameters. In addition, it can analyze defects by size, location, frequency, and presence/absence. This provides the user with invaluable insight into the characteristics and behavior of defects. KLA P11 is designed to accommodate a wide range of metrology applications and is specifically designed to reduce measurement time. It offers both high accuracy and high-speed measurements, giving users the best performance available. This tool helps manufacturers meet their production goals by providing the best possible insight into their processes. Finally, KLA / TENCOR P-11 offers advanced features such as remote monitoring and control, as well as full image archiving for future analysis.
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