Used KLA / TENCOR P11 #9086448 for sale

ID: 9086448
Wafer Size: 8"
Vintage: 2000
Surface profiler, 8" 2000 vintage.
KLA / TENCOR P11 Wafer Testing and Metrology Equipment is a high-end automated inspection and metrology tool. It is an integrated system that combines a 5-megapixel color CCD camera, an array of powerful algorithms, an automated scanner, and a full suite of measurement software, providing a comprehensive solution for wafer probing and metrology. The unit is designed to perform both wafer and die level measurements quickly and accurately. The machine's camera utilizes a CCD imaging sensor with a 5-megapixel resolution with a full color video output. The camera's image capture capability captures both wafer and die images, as well as allowing for selection of variable exposure times and aperture sizes for optimal resolution. The automated scanner is designed for maximum throughput with precision motion stages and provides data transfer to the imaging tool at speeds of up to 4MHz. In addition, an array of advanced image processing algorithms are employed which utilize both imaging and non-imaging techniques to accurately measure and identify critical lithography, process, topography, and other critical characteristics. KLA P-11 Wafer Testing and Metrology Asset utilizes a full suite of custom measurement software to provide a comprehensive solution for critical wafer characteristics. The software enables complete independence of the customers' infrastructure, as well as providing advanced image analysis, data logging, and a variety of customizing options. The software provides a wide range of measurement capabilities which include measuring across various device layers, die sizes, wafer locations, feature sizes and shapes, parallelism, beam mapping, and through-focus analysis. The application is also capable of analyzing large field-of-views in a single shot, which helps reduce data acquisition times. TENCOR P 11 Wafer Testing and Metrology Model is designed for integration into semiconductor manufacturing lines and processes, requiring no proprietary equipment. Robust instrumentation, superior performance, automated processes, and sophisticated algorithms are combined to deliver an accurate and repeatable production monitoring equipment. The system is capable of continuous operation in a variety of temperatures and humidity levels and provides superior reliability across different manufacturing processes. In conclusion, P11 Wafer Testing and Metrology Unit is a comprehensive and reliable machine designed for high-end automated inspection and metrology. The tool integrates a powerful 5-megapixel camera, automated scanner, and a suite of measurement software to provide superior measurement capabilities across a wide range of processes and applications. The asset's sophisticated algorithms provide accurate, repeatable, and reliable results, while its robust outdoor grade components ensure longevity and high availability even in extreme environments.
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