Used KLA / TENCOR P11 #9243727 for sale

KLA / TENCOR P11 is a wafer testing and metrology system designed to provide highly accurate probers for semiconductor wafer testing and metrology applications. Built on the success of the previous P-Series probers, KLA P-11 brings a number of exciting new capabilities to the manufacturing floor. Featuring an innovative dot-illuminated design, TENCOR P 11′s optical metrology system enables users to quickly identify failing wafers and take corrective action, ultimately improving yields and reducing costs. P 11 boasts enhanced 3D calibration and clustering tools, which allow users to accurately and quickly identify non-contact defects on the substrates. Novel multi-frequency excitation modes provide improved high-resolution imaging with exceptional repeatability and reproducibility. In addition, the integrated high-resolution spectrophotometer provides convenient and highly accurate spectral characterization of hundreds of different materials across multiple process nodes and feature sizes. KLA P11's easy to use and intuitive software makes everyday operation a breeze. Its user-friendly Graphical User Interface presents all data at the fingertips, enabling users to monitor wafer condition and take the appropriate countermeasures if required. KLA P 11 also comes equipped with an intelligent automation suite. This facilitates high throughput, increased throughput, and improved accuracy. Advanced laser mapping is used for both static and dynamic pattern mapping to identify minute process variations and non-contact defects with superior accuracy. P11 was designed to provide operators with maximum flexibility. It supports interchangeable wafers sizes (up to 8-inch) and can be used with a wide range of test, metrology, and lithography systems. TENCOR P11 consists of a variety of modules that can be configured to meet the performance, accuracy, and analysis needs of the users. KLA / TENCOR P-11's comprehensive features make it a robust, effective, and accurate wafer testing system. It is applicable to a broad range of applications, including IC process qualification and yield enhancement, Reliability testing, Process monitoring, Failure analysis, Reverse engineering and metrology. Its advanced metrology technology provides faster testing times and higher production yields.