Used KLA / TENCOR P11 #9248607 for sale

KLA / TENCOR P11 is a state-of-the-art wafer testing and metrology equipment designed to provide rapid and accurate process control feedback at each step in the semiconductor fabrication process. It combines the features of defect inspection, overlay metrology and defect review. The system is compatible with a wide range of probe cards and with mask patterns that are compatible with industry leading mask rule checkers. KLA P-11 is equipped with High Definition HD Super-Resolution technology, providing superior wafer imaging capabilities to enhance defect detection accuracy. The unit uses advanced algorithms to analyze images of wafers and analyze defects, allowing for accurate and reliable defect classification and defect review. This allows for quick and accurate defect recognition, allowing for wafers with very minute non-uniformities to be quickly and accurately identified. TENCOR P 11 utilizes a multi-sensor approach for non-contact overlay metrology. This allows for quick, accurate and repeatable alignment measurements between the mask and the underlying silicon wafer. By voxel alignment and inspection of the surface topology of the underlying silicon wafer, the accuracy of this alignment can be maintained over multiple wafers and lots. KLA / TENCOR P-11 wafer testing and metrology machine runs on a standard off-the-shelf computing platform. It provides an intuitive user interface on the tool screen with a well-structured set of menus and buttons that allow operators to quickly access all asset modes, parameters and settings. In summary, P11 is a state-of-the-art wafer testing and metrology model. It provides superior wafer imaging capabilities for defect detection accuracy, accurate and repeatable results for non-contact overlay metrology, and a well-structured user interface that enables operators to manage the entire process quickly and efficiently.