Used KLA / TENCOR P11 #9248608 for sale

KLA / TENCOR P11 is a wafer testing and metrology equipment designed to deliver comprehensive critical dimension, overlay and surface metrology. This system provides comprehensive optical critical dimension, film thickness, and overlay measurement services, integrated with a state-of-the-art digital imaging technology. The unit features a rugged and robust digital imaging platform with a non-contact optical imaging machine for real-time and high-precision measurements of the physical and electrical properties of semiconductor wafers. The imaging tool offers image capture and analysis at submicron resolutions, enabling high-precision measurements of wafer features. KLA P-11 includes a variety of software options for inspecting and measuring critical dimension, overlay and surface metrology. This software includes advanced metrology tools such as measurement repeatability evaluation and process tool monitoring. The asset also supports real-time imaging to aid in improving manufacturing processes. The model is designed to offer superior accuracy and repeatability in wafer testing and metrology. It adopts a specially designed light source to reduce the influence of electro-static, signal frequency, and other interference factors on measurement accuracy. The equipment offers a wide range of parameter settings, ensuring accurate and repeatable measurements. TENCOR P 11 also benefits from a graphic user interface that is intuitive and user-friendly. It aids in setup, operation, and data review. The system supports standard open-architecture data interchange formats and measurement capabilities, making it a valuable tool for the semiconductor industry. P-11 is a powerful unit for wafer testing and metrology. It provides superior accuracy, repeatability and adaptability to the user's measurement requirements. It offers the latest technology, user-friendly operation, and provide the highest levels of metrology performance.