Used KLA / TENCOR P11 #9250103 for sale

KLA / TENCOR P11 Wafer Testing and Metrology equipment is an advanced automated optical inspection and metrology system that enables real-time performance monitoring and process control of wafers and products. By utilizing a high-resolution optical microscope, KLA P-11 is able to accurately analyze wafer features, die-by-die uniformity, and relatively measure exact product thickness and overlay offsets. TENCOR P 11 utilizes an 8" or 12"-inch field of view with numeric-aperture (NA) as low as 0.18, providing an accuracy resolution of 1 micron, and a fast image acquisition rate of up to 8 frames per second. A wide range of optical components provide comprehensive parameters and measurement types for application support in production lines including geometric and etch analysis, document review and network verification. KLA / TENCOR P 11 also offers fast and reliable defect classification capability, which allows users to quickly analyze large quantities of data and get immediate results with just one click. Special algorithms detect and classify defects automatically, providing a reliable and repeatable process for characterizing, classifying, and validating Semiconductor wafers and materials. The main module of P11 consists of Metrology, Review & Pattern Search, and the Defect Review Platform. An intuitive user interface makes operation simple and eliminates lengthy set-up times. Data output is stored in a centralized repository allowing visibility and access to real-time performance metrics while facilitating defect knowledge sharing with global defect library. TENCOR P-11 unit also offers Traceability & Analysis and Net/Yield Management capabilities. This machine operates with sophisticated capacitance-type sensors that are able to visualize inspections results in three-dimensional images, which makes it perfect for industry-grade wafer process monitoring and defect analysis. Finally, the Tool Manager tools enable users to monitor asset performance and run various tests for quality assurance. KLA P 11 is an extremely versatile tool for the inspection, monitoring and analysis of wafers and products in today's production lines. The tool helps to ensure reliability and accuracy of the process to ensure high-performance results and yield.