Used KLA / TENCOR P11 #9293256 for sale

KLA / TENCOR P11 wafer testing and metrology equipment is an automated system designed for on-wafer measurements of microelectronic devices, MEMS, and photonics components on large (up to 300mm) silicon wafers. KLA P-11 utilizes advanced pattern-recognition algorithms to identify individual patterns and device structures on large wafers, and then measure them using its high-resolution imaging capabilities. TENCOR P 11 achieves precision and repeatability with its active vibration isolation, auto-focus and potentiometer controlled auto-stage, delivering high-accuracy measurements for wafer-level tests. KLA P 11 unit is comprised of several subsystems, such as a motion controller, data acquisition machine, and imaging tool. The motion controller offers x-y-z translation and rotational stages to pinpoint devices on the wafer with great accuracy. The data acquisition asset offers high-speed data acquisition capabilities with digital/analog and digital/digital (D/A and D/D) input/output units. KLA / TENCOR P-11 imaging model is a proprietary microscope design with on-board LED illumination and up to 20x optical zoom magnification with 0.5 𝛍m spot resolution setting. Water immersion objectives and sample holders enable the equipment to accurately measure samples with varying sample heights and properties, while specialized software enable characterization of complex device structures. P-11 also features automated pattern recognition algorithms for die recognition, alignment/registration, vector plotting, and device classification. A user-friendly graphical user interface makes the system easy to program and control. KLA / TENCOR P 11 unit offers enhanced accuracy, resolution, and repeatability of measurements for wafer-level tests. It offers an all-in-one package for wafer testing and metrology, with features such as sample holders, lighting and objective lenses, vibration isolation, and auto-focus capabilities, allowing users to quickly produce accurate and repeatable results. With advanced pattern recognition algorithms, KLA P11 offers a cost-effective, quality-controlled solution for testing, analyzing, and characterizing complex die structures.