Used KLA / TENCOR P11 #9355497 for sale

KLA / TENCOR P11 is a wafer testing and metrology equipment developed by KLA. It uses leading-edge technology for accurate measurements and data interpretation on a variety of semiconductor materials. The system is designed with a linear scan stage for rendering large shapes, long motion ranges, and a high repeatability to ensure precision, repeatability and accuracy. KLA P-11 is capable of measuring the physical characteristics of wafers, such as thickness, flatness, radius of curvature, bevel and radius, as well as electrical characteristics such as capacitance, resistance and dielectric properties. It uses a lightning-fast CMOS-based imaging unit to detect defects on the wafer surface and an automatic computer-aided metrology functionality to quantify such defects. The machine's high-resolution imaging capabilities enable the detection of minute defects on wafers and TENCOR P 11's 4-axis measurement head is able to accurately scan a variety of materials in a short amount of time. It is also capable of scanning both rough and smooth surfaces with a highly precise step control. The tool also has advanced analysis algorithms to identify tolerances and quantify variation between components. It can measure a variety of features in multiple directions at various speed and accuracy levels, which enables precise and fast results. TENCOR P-11 offers an intuitive user interface and flexible networking capabilities; allowing remote access and control from a variety of platforms. It also covers a wide range of wafer sizes from 8" to 12" and is designed to facilitate high throughput and maintains low total cost of ownership. P-11 is a versatile tool for quality control in semiconductor manufacturing, providing reliable, precise and accurate results. With its rich features and flexible design, it is the perfect tool for any semiconductor manufacturing facility.