Used KLA / TENCOR P11 #9375263 for sale

ID: 9375263
Vintage: 2000
Surface profiler 2000 vintage.
KLA / TENCOR P11 is a wafer testing and metrology equipment designed for measuring the electrical properties of semiconductor wafers. The system is ideal for wafer testing on small wafers, thin wafers, and polysilicon substrates. The unit is virtually maintenance-free, allowing for longer periods of use without requiring regular maintenance. KLA P-11 has advanced 2-D dispense and scatterometer metrology capabilities to ensure accurate test results. It uses a multiple probe dispense machine with advanced, low-pressure pneumatic probes to ensure consistent and reliable testing. The tool can detect, measure, and analyze all the components of the wafer and perimeters, including wafer boundary, edge, and defect characterization. TENCOR P 11 is integrated with the P12 Series Process Control Asset (PCS) with an advanced, interactive color graphical user interface (GUI). The interactive GUI allows the user to customize, tune, monitor, and control chip testing operations, including setting up and controlling calibration, test, and report functions. The PCS also provides data analytics to optimize yield and performance of the chips. P 11 is capable of mounting multiple wafer types as it is equipped with a multi-directional wafer handler and advanced wafer verification model. It also allows for scanning at a variety of angles towards all parts of the wafer. The equipment can also be configured to accommodate manual wafers, if needed, through the addition of special brackets or base plate holders. Overall, KLA / TENCOR P-11 is an advanced system for measuring the electrical properties of semiconductor wafers. It has advanced metrology capabilities, a customizable GUI, and is suitable for different wafer types and orientations. The unit also allows for efficient and reliable wafer testing and chip performance optimization for all stages of production.
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