Used KLA / TENCOR P11 #9381675 for sale

KLA / TENCOR P11 is a robust and productive wafer testing and metrology equipment that enables quality assessment of semiconductor wafers. With advanced automation and high-throughput capabilities, it is suitable for use in both development and production test stages. KLA P-11 features a very high throughput stage, with fast and accurate positioning and autofocus, which makes it ideal for measuring complex wafer profiles. It is equipped with an advanced radio frequency (RF) data acquisition system that enables faster measurement of critical characteristics such as thickness and defect size. It is also equipped with high resolution infrared (IR) imaging to detect surface defects, and it has a very fast stage release mechanism that reduces cycle time. TENCOR P 11 is designed to provide high accuracy in semiconductor wafer metrology and testing. It features proprietary patented metrology and data acquisition technology which enables in-depth diagnostics and analysis. The unit features high-precision scanning systems to accurately detect thin and thick films, as well as very small defects. It also features advanced image processing algorithms that enable rapid detecting, categorizing, sorting, and printing of critical defects such as particles, voids, and delamination. Moreover, P 11 machine provides a range of defect analysis capabilities and data analysis tools that enable accurate prediction of yield trends and failure analysis. P-11 supports automatic pattern recognition, which enables it to quickly detect and process feature images with varying shapes and sizes. With its advanced optical systems and proprietary software technologies, it is capable of performing a variety of different wafer measurements such as profile height, edge pull, etching depth, resist thickness, topography, crystal defects, thin film deposition, and diffusion depth across a range of different materials. KLA / TENCOR P 11 tool also features real-time non-contact monitoring of production stages, providing real-time alerts to alert operators of potential product quality issues, allowing for proactive corrective action to prevent costly production delays. Additionally, the asset includes a versatile control interface, which facilitates efficient and effective operation by non-expert operators. Overall, KLA / TENCOR P-11 is an advanced, reliable, and high-throughput wafer testing and metrology model designed to provide precise and accurate measurements of semiconductor wafers. With its advanced optical and software technologies, precise defect analysis capabilities, and versatile control interface, TENCOR P-11 is an ideal choice for high-volume wafer production environments.