Used KLA / TENCOR P12 #293595755 for sale

KLA / TENCOR P12 is a wafer testing and metrology equipment designed to provide precise measurements of wafer surface topography and chemical composition. This system has a broad range of capabilities, making it suitable for a variety of semiconductor and optoelectronic applications. KLA P 12 features a scanning electron microscope (SEM) column, a universal stage, and a vertical stage. The SEM column provides high resolution imaging to reveal fine details of the wafer surface. The universal stage is capable of handling wafers up to 200mm in diameter and has two stages, allowing it to be positioned for imaging at different angles. The vertical stage further allows for fine positioning of the wafer under the electron beam. TENCOR P-12 includes a high-speed autofocus camera to quickly and accurately locate the desired surface features. This camera is connected to a PC-based imaging platform for 2D and 3D analysis and imaging. Additionally, the unit is equipped with a number of optional accessories, such as an ion source, a low-vacuum chamber, and an EDX (Energy Dispersive X-Ray) detector, providing chemical analysis capabilities. KLA / TENCOR P-12 boasts a comprehensive metrology suite. Its menu-driven software features user-friendly design and is capable of multi-parameter measurements, including: slope measurement, CD (critical dimension) metrology, x-y stage calibration and alignment, and defect analysis. CD metrology proves particularly useful for ensuring the accuracy and uniformity of wafer patterns. The machine is also configured with an auto-alignment function that easily aligns multiple wafers on the wafer stage. Overall, TENCOR P 12 wafer testing and metrology tool is an ideal choice for many semiconductor and optoelectronic applications which require fast, accurate, and detailed measurements of the wafer surface. With its powerful imaging capabilities and a range of measurement functions, it provides industry-leading results and is a reliable tool for everyday use.