Used KLA / TENCOR P12 #9379232 for sale

ID: 9379232
Surface profiler.
KLA / TENCOR P12 is a wafer testing and metrology equipment designed to perform high-precision measurements and measurements of integrated semiconductor wafers. This system is made up out of various components designed to provide the highest quality test and evaluation data. KLA P 12 has a high resolution CCD camera that provides precision imaging capabilities, it also has the ability to perform interactive or automated alignment to assist in critical wafer assembly processes, and can process upwards of 2,000 wafers per hour. The imaging processor utilizes a 1X imaging lens for computationally intensive analysis processes and can be used for high speed wafer mapping, followed by step-by-step action to examine defects with the highest level of detail. TENCOR P-12's automated wafer handling unit utilizes a robotic arm to position a wafer in the analysis chamber for imaging, inspection and fabrication testing, ensuring that all steps of the process can be completed quickly and safely. This machine is designed with multiple safety features, including a safety interlock option to provide improved wafer safety. P 12 is equipped with laser-based metrology systems for accurate and precise line width, step height and oxide thickness measurements. It also uses optical spectroscopy techniques for detecting micro-scale material features and performing non-contact, high-speed tests such as oxide thickness measurement and alkali-silica reactivity testing. The tool is also capable of performing comprehensive defect inspection and classification, and provides a range of wafer assembly evaluations for defect defect coverage, perfect cover position, critical dimensions and wiring integrity. TENCOR P 12 is designed with a high-powered computing platform to support a variety of third-party analysis software such as yield analysis and defect detection. It can provide invaluable data to help customers in optimizing the performance of their products. In addition, TENCOR P12 also includes a library of advanced metrics for further analysis, and supports internet-based data sharing for collaboration with suppliers, partners and colleagues. KLA P-12 is an advanced wafer testing and metrology asset designed to optimize the process of semiconductor wafer fabrication. With its comprehensive feature set, KLA / TENCOR P-12 offers highly accurate imaging and metrology, automated wafer handling, and a library of advanced metrics, all designed to provide reliable and accurate test data and analysis for customers.
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