Used KLA / TENCOR P12 #9392418 for sale

KLA / TENCOR P12 Wafer Testing and Metrology Equipment is a versatile and automated system for wafer testing and inspection. The unit is designed to accept 8" or 12" wafers with an overall footprint of less than 17 square feet, allowing for maximum lab space utilization. The machine is multi-functional and provides a variety of wafer inspection, metrology, and testing applications. The tool consists of a control unit, motion and wafer handling components, and the process control/inspection modules. The control unit includes a 19-inch rack-mounted controller that can be installed in any 19-inch cabinet or rack. The asset also includes the motor drive boards, motion cards, multi-axis servo heads, and the wafer handling components required to support wafer transport. The model features high-precision force sensing and motion control capabilities with positioning accuracy to within one micron, and supports up to three simultaneous operations. It also includes the process control/inspection modules needed to perform the actual metrology, inspection, and testing operations. The process control/inspection modules include wet station imaging, dry station imaging, chemical/metallurgical analysis, and specific defect measurement and review. The equipment is designed for high throughput and reliability, with automated operations and statistical process control. The system also comes with a software package that allows for the creation of custom recipes and is capable of capturing and reporting detailed results and data. The unit is designed to be user-friendly and easy to use, with an intuitive graphical user interface and interactive tutorials. KLA P 12 Wafer Testing and Metrology Machine is suitable for use in a variety of industries, including semicondutor and solar cell production. It is also a valuable tool for research and development operations. With its fast processing speed, robustness, and wide range of process control options, TENCOR P-12 is an ideal tool for wafer testing and metrology.