Used KLA / TENCOR P15 #293592474 for sale

KLA / TENCOR P15 is a high-end wafer testing and metrology equipment designed to minimize wafer inspection time and reduce defectivity. KLA P-15 system is designed with both top-down and bottom-up wafer test architectures which is used for both electrical and optical metrology. It also features advanced optics to support a wide range of metrology functions such as laser interferometry and photometry. The unit is equipped with a high-end optics machine including 9-axis path navigation, an optical laser interferometer, and a diffraction grating unit. This advanced optics tool allows for precise wafer mapping and allows for accurately measuring the wafer's planar contours, height variations, and other light characteristics in a reliable and accurate manner. It can also measure defects in the wafer's surface, providing accurate analysis and inspection of the wafer's condition. TENCOR P 15 asset is equipped with an array of sensors that measure electrical properties, optical properties, and die-by-die characteristics. This helps with fast and accurate wafer characterization and defect localization. The model also has a high accuracy X-ray and wafer mapping equipment, allowing for rapid and accurate defect localization and classification, making it highly efficient and reliable in wafer inspection. P 15 system utilizes the latest in pattern recognition technology, allowing it to differentiate between defects that are caused by processing and environmental factors, thereby aiding in better defect diagnosis and prevention. The unit has a built-in 'flexible adjustment' feature that allows for real-time adjustment of individual parameters for various throughput requirements. This helps to ensure that the machine can accommodate different wafer sizes, as well as wafer materials and metrology requirements. Overall, TENCOR P-15 wafer testing and metrology tool is designed and created with the aim of helping to minimize wafer inspection time and reduce defectivity. It continues to be a useful and reliable tool for wafer inspection and characterization as it is reliable, accurate, and highly efficient.