Used KLA / TENCOR P15 #293633404 for sale

KLA / TENCOR P15 is an advanced wafer testing and metrology equipment that enables high-precision, automated defect and yield management. The system features an integrated platform to ensure the highest level of efficiency and accuracy for testing a wide range of semiconductor wafers. KLA P-15 unit leverages two advanced technologies, Bright Field (BF) and Dark Field (DF) imaging technologies. The BF machine provides the overall picture of the wafer's surface, capturing defects that cannot be seen using traditional methods such as scanning electron microscopy. The BF tool is also used to identify small defect types such as particles, strain, cracks, and pits. In addition to the BF asset, TENCOR P 15 also employs the DF model to look deep inside the wafer. This equipment has greater resolution than the BF system, allowing it to detect even smaller defects on the wafer with higher precision. With its enhanced resolution, the DF unit is able to detect intra-wafer and inter-die defects, as well as any structural issues that may exist. Additionally, the DF machine is used to measure precise geometries and ensure precise dimensions of the wafer. KLA / TENCOR P 15 tool is highly precise and reliable for wafer testing and metrology applications, and it provides a comprehensive set of features for accuracy and speed. Its automated testing algorithms, high resolution imaging capabilities, powerful wafer handling components, novel illumination modes, and advanced data analysis capabilities make it an ideal solution for all types of semiconductor wafer testing and metrology applications. TENCOR P15 also includes a range of automated test routines that enable high-throughput analysis, while providing real-time feedback on the results of each test. This makes it easier to identify and prioritize manufacturing problems and yields, allowing manufacturers to take swift corrective actions if required. Additionally, the asset's modular, scalable design lets users build up the model over time, allowing them to increase its capacity and performance as their operations grow and evolve. Overall, KLA P15 is an advanced wafer testing and metrology solution that offers a comprehensive set of features and capabilities that allow manufacturers to achieve the highest level of quality and efficiency. With its high-precision imaging capabilities, automated test routines, and modular, scalable design, P-15 is well-suited for any semiconductor wafer testing and metrology requirements.