Used KLA / TENCOR P15 #293657257 for sale

ID: 293657257
Vintage: 2003
Surface profiler 2003 vintage.
KLA / TENCOR P15 wafer testing and metrology equipment is a cutting-edge tool for the semiconductor industry. It is a system made up of multiple instruments designed to identify, measure, and analyze a wide range of physical properties within the semiconductor wafers. The unit has high-performance imaging technology combined with advanced analysis and processing algorithms, allowing it to quickly and accurately analyze test results. It is capable of measuring a variety of wafer characteristics, including wafer flatness, total side-wall roughness, and topography. It also possesses advanced defect inspection capabilities, which allow it to detect defects such as particles, pits, scratches, and corrosion damage. It is designed to achieve fast and repeatable measurements across a full wafer stack. The machine is equipped with an advanced control architecture that provides full automation of measurement and analysis operations. It includes sensors to monitor and control the environmental conditions inside the tool, as well as a precision stage for accurate sample positioning. Its software features a user-friendly graphical interface, automated reporting capabilities, and full data storage to ensure traceability of measurements. KLA P-15 asset is well-suited for a variety of semiconductor fabrication processes, including 3D semiconductor integration, advanced lithography metrology, back-end process tracking, and packaging investigations. Its high-resolution capabilities and automated software make it an ideal choice for advanced semiconductor research and development. The model is equipped to handle various types of sample sizes, with a capacity of up to 200mm wafers, and its compatibility with a number of test methods makes it a particularly suitable choice for characterization projects. Therefore, TENCOR P 15 wafer testing and metrology equipment is a reliable, precise, and easy-to-use tool for the semiconductor industry. Its wide compatibility, automation capability, and high-resolution imaging technology make it an ideal choice for characterization projects, research and development, and production-line quality control.
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