Used KLA / TENCOR P15 #293662986 for sale

KLA / TENCOR P15
ID: 293662986
Surface profiler.
KLA / TENCOR P15 is a wafer testing and metrology system that offers users high analyte performance, flexibility, and fast cycle times for materials analysis. KLA P-15 utilizes advanced optical metrology technologies, including spectroscopic ellipsometry, optical scatterometry, and a variety of other tools to characterize a wide range of samples, from microelectronic, optical and biological components. TENCOR P 15's design is based on the concept of dual aperture metrology which provides enhanced optical precision through two closely spaced optical channels, giving flexibility for single or dual view measurements. Additionally, its customizable sample-clamping system and adjustable sample-contact pressure allows it to accommodate a wide variety of sample shapes and sizes. The system includes a fully integrated suite of data handling, analysis, and visualization software. It has an adaptive sampling engine which learns from each measurement and then applies this knowledge to optimize future tests, and an autofocus feature which ensures accurate measurements with minimal intervention from operators. Additionally, its self-calibration feature helps to ensure repeatable results over time and reduce maintenance costs. KLA / TENCOR P 15 also boasts a thermal chamber for temperature-controlled testing, which is useful for materials science research as well as process validation and testing. This chamber ensures accurate analysis for samples tested in various temperatures, with a maximum measurement range of -60°C to +400°C. TENCOR P-15 is designed for high-precision and high-throughput applications which require accurate characterization of optical and physical behaviours of the sample under investigation. Its extremely high accuracy, advanced metrology technology, and automated data handling capabilities make it a valuable tool for materials scientists, engineers, and designers alike.
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