Used KLA / TENCOR P15 #293750855 for sale

KLA / TENCOR P15 is a renowned wafer testing and metrology system used in the semiconductor industry. It offers high resolution and fast wafer defect coverage, within a low cost and easy to use platform. KLA P-15 combines a unique blend of hardware and software to offer wafer defect coverage in less than 0.2 microns. By combining advanced hardware with automation and metrology software, TENCOR P 15 seamlessly aligns and intercepts defects to improve yield and reduce scrap. TENCOR P-15 features a Scanning Acoustic Microscope (SAM) module housed within a common platform, which provides a high resolution for defect detection and analysis. The vehicle enables rapid yet accurate scanning, alignment, and acquisition of defect data with easy and quick data registration, analysis and display. The system also offers five microscope options - up to 1,000X optical magnification, and up to 10,000X Digital Intermediate Magnification (DIM) for capturing and pinpointing the tiniest defects. In addition, P15 offers feature matching, a crystallographic analysis and characterization technique, which enables automated visualization of defect type and distribution. P-15 software provides automated wafer defect inspection and analysis by making use of wafer maps presented in 2D and 3D images. These maps provide defect coordinates, feature shape, and size, along with a 3D representation of the defect. By combining hardware and software features, KLA P15 offers an effective solution for testing large batches of high quality semiconductor wafers. The efficient and cost effective platform integrates advanced automation and metrology features, ensuring reliable quality and detailed defect coverage.