Used KLA / TENCOR P15 #9154043 for sale

KLA / TENCOR P15 is a wafer testing and metrology equipment designed to provide high-precision, fully automated metrology solutions to semiconductor device fabrication facilities. KLA P-15 system is the most advanced technology available for wafer process control, defect detection, and layer measurement. It provides both electrical testing and optical metrology solutions to assess surface topography, morphology, texture, and process-defects in semiconductor devices. The unit provides a wide range of metrology and testing capabilities, including electrical testing, optical inspection, 2D/3D surface and critical dimension (CD) measurements, yield analysis, defect characterization, and automated feature detection. It features advanced optics and vision sensing technology, allowing for the measurement of up to four wafers simultaneously. The machine is also equipped with a semi-automated workflow and features graphical user interface (GUI) for easy and precise control of the wafer testing process. TENCOR P 15 tool is capable of generating a variety of precise measurements of the semiconductor layers and their thickness, with high spatial resolution, low partial damage to the specimens, uniform precision across the entire wafer, and an automated reporting asset. It also allows for the identification and classification of process-defects, such as scratches, particles, hillocks and voids, by performing multi-parametric analyses, employing an advanced image processing algorithm. KLA P 15 also offers an extensive suite of data analysis and reporting capabilities. It enables users to generate detailed reports, detailed defect maps and yield analyses, using custom parameters and thresholds. Additionally, the model offers powerful automation capabilities and advanced data mining, allowing users to examine millions of data points and analyze their trends in real time. TENCOR P-15 is an advanced, best-in-class equipment for testing and metrology, delivering high accuracy and providing the utmost reliability in semiconductor device fabrication operations. It is a valuable tool for ensuring quality control and maintaining process stability.