Used KLA / TENCOR P15 #9159740 for sale

ID: 9159740
Surface profiler.
KLA / TENCOR P15 is a state of the art wafer testing and metrology equipment designed for the advanced testing, metrology and inspection of small and large semiconductor devices. KLA P-15 offers multiple capabilities, including advanced functions for the test and measurement of feature sizes, etch depths, transistor leakage current, etc. All of the capabilities are included on a single platform, reducing complexity and cost. TENCOR P 15 provides a low-cost solution to the testing, metrology and inspection of wafers. It utilizes a patented imaging system and advanced algorithms to deliver improved performance while also reducing time-to-measure. The unit also features full-field mapping at a resolution of 5 microns. This allows for higher precision measurements and quicker cycle times. The machine is capable of measuring a wide range of parameters, including device critical dimension (CD), etch depth, transistor leakage current, and deposition adhesion. P-15 also offers advanced defect inspection capabilities. The unique imaging hardware and advanced algorithms allow for more reliable and accurate detection of defects, allowing for proactive process control for improved yield and device reliability. KLA P15 also offers enhanced data analysis capabilities, including automatic concentration trend generation, defect size reporting, and advanced statistical analysis. This powerful analysis capability allows for easy identification of issues, improved process control and higher yield and device consistency. Overall, P15 is an advanced wafer testing and metrology tool with powerful capabilities and flexible options. It is designed to provide the highest levels of accuracy and reliability to ensure quality and consistency of devices. KLA / TENCOR P-15 makes it easy to test, measure, inspect and analyse data, reducing complexities and cost while improving yield and device reliability.
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