Used KLA / TENCOR P15 #9166831 for sale
Tap to zoom
Surface profiler P/N: 0015121-000 Upgraded PC: Pentium 4 LCD Monitor, 19" Keyboard and mouse SSD Hard Disk Drive (HDD) Air table included L-Stylus: 2 um/60 Operating system: Windows XP Operation manual 2004 vintage.
KLA / TENCOR P15 is a wafer testing and metrology equipment designed to accurately and efficiently test and analyze wafers used in today's semiconductor industry. The system utilizes its 3-D Automated Feature Recognition (AFR) technology that allows the high-speed analysis of wafers down to the micro-scale level. This capability enables KLA P-15 to accurately and quickly identify shapes, feature sizes and locations. TENCOR P 15 is a high-resolution unit, built with a fast electron beam optical machine that can capture high-resolution images without distortion. This tool has historically been used as a tool for inspecting and measuring precision parts and semiconductor wafers. Its imaging and analysis capabilities now expand to include defect detection and failure analysis. Additionally, KLA P15 has the capability of measuring depths, widths and heights with a precision of one micron or less. KLA P 15 has the flexibility to accommodate multiple wafer types and sizes, ranging from 100mm to 300mm. The asset is designed with a robust welded steel frame, to offer vibration isolation during testing and maximum accuracy. Advance high-power computed tomography (CT) scanning and filtering capabilities help to accurately scan and analyze the wafer data with real-time capture of over 35 million features across the wafer surface. P-15 has an intuitive user interface and provides intuitive "drag and drop" features, to quickly customize the model's testing and metrology capabilities. Additionally, P15 is capable of advanced data collecting, storing, editing and exporting. Data analysis programs are also accessible for quick visualization of results and streamlined communication. KLA / TENCOR P-15 is an advanced wafer testing and metrology equipment that can be used for numerous applications and offers unparalleled analysis capabilities. Its high-resolution imaging, fast acquisition speed and intuitive user interface makes TENCOR P15 system an ideal choice for industries that rely on accurate and reliable defect detection and failure analysis. P 15 provides an all-in-one solution for wafer testing and metrology, and is a must-have for any level of production.
There are no reviews yet