Used KLA / TENCOR P15 #9261862 for sale

KLA / TENCOR P15 is an automated wafer testing and metrology system. It is a multi-tool platform that is used for advanced wafer inspection, defect classification, optical acquisition, and non-contact topography. KLA P-15 is designed to perform wafer testing and metrology with high accuracy and high throughput. It offers both advanced optical and non-contact modes. In optical mode, TENCOR P 15 can measure reflectivity, optical contrast, and material contrast. Additionally, it can generate nanoscale profile data in order to measure critical dimensions and feature heights. In non-contact mode, it can detect small defects by using laser scanning techniques. P 15 is designed with advanced analytics capabilities. With its AI-driven algorithms, TENCOR P-15 is able to automatically detect, identify and classify a wide range of defects. It also features advanced pattern matching algorithms that enable faster and more accurate review of wafer maps and data. In terms of accuracy, KLA P15 has a maximum resolution of 0.4 µm with an accuracy of 0.1 µm. Its dynamic range can be as high as 10 million:1. Additionally, KLA / TENCOR P 15 is designed to be highly flexible, allowing users to easily reconfigure the system according to different metrology requirements. Furthermore, P-15 is designed to be ergonomic, with easy access to sample loading, samples changeover, and wafer map review. Overall, KLA P 15 provides users with an advanced wafer testing and metrology system. Due to its accuracy, flexibility, and ergonomics, it is well suited for a range of applications in semiconductor manufacturing.