Used KLA / TENCOR P15 #9265341 for sale

KLA / TENCOR P15 is a wafer testing and metrology equipment used for process control and defect inspections in semiconductor manufacturing facilities. It works by using automated optics to inspect a semiconductor wafer and measure element variation, topography, and diamond distributions. KLA P-15 utilizes a variety of sensors such as a CCD (charged-coupled device) that captures images of the wafer and a laser that is used to scan the surface. It performs multiple measurements including surface roughness and topography as well as defect inspection. TENCOR P 15 is designed for high-speed, high-accuracy inspection, with a sampling rate of 400 WPH (wafer per hour) and a resolution of 1.5 um. It has a 5nm measurement accuracy, with the ability to detect sub-micron defect sites and process variation across the wafer. The system also has a variety of communication protocols, such as network, serial, and SCSI interfaces, allowing for integration into existing production environments. TENCOR P-15 unit is aimed at improving costs for semiconductor manufacturers, as it is designed to reduce the time and materials required for production. The machine is equipped with a "Smart Rating" feature, which allows for optimal pass/fail decisions based on a user-defined statistical rating, ultimately resulting in fewer rejects and reduced cost. P 15 also has an automatic calibration procedure which streamlines wafer inspections by getting the measurement settings, calibration, and recipes set in just a few minutes. Overall, KLA P 15 is a powerful tool for semiconductor production that can save time, money and improve yields. Its high-accuracy, high-speed inspection capabilities provide accurate and consistent measurements and yield more reliable results. The automated calibration, integrated capabilities, and Smart Rating feature provide cost-effective defect inspections and process control that improve productivity.