Used KLA / TENCOR P15 #9302869 for sale

KLA / TENCOR P15 wafer testing and metrology equipment is an automated metrology platform that can accurately measure various characteristics of semiconductor wafers. It offers a comprehensive range of wafer tools, including a wafer mapping tool, optical metrology tools, acceleration testing tools, and a wide range of other measurement and analysis tools. It has also been designed to be easy to operate, with an intuitive user interface and a comprehensive library of standard and custom-made test procedures. KLA P-15 comes with a number of powerful optical metrology tools, such as a contouring tool and a thickness profiler. It is designed with an automated focusing system that ensures accurate measurements in a fraction of the time of manual techniques. Additionally, TENCOR P 15 features a high-power laser beam for laser texturing and wafer patterning applications. The laser utilization voltage is adjustable for specific applications, and the laser can be set to pulse mode for higher precision results. KLA P 15 can also measure the acceleration of a wafer. The unit uses high-speed accelerometers and a high-precision encoder to accurately measure the acceleration and deceleration of a wafer during testing. Additionally, the wafer acceleration/deceleration testing tool can be used to create repeatable test results and ensure the quality of the wafer. The machine also has a multi-column wafer mapping tool that is designed to accurately map the surface of a wafer. The tool uses an array of 16 columns to easily create a map of the wafer surface, including its thickness, height, area, and more. The tool can also be operated through a standard software interface for optimal ease of use. Overall, P 15 is an automated metrology platform that offers a range of powerful tools and features for wafer testing and metrology. It has been designed with a user-friendly interface and can achieve accurate results in a fraction of the time of manual methods. Additionally, KLA P15 is equipped with a variety of tools for measuring the acceleration and deceleration, contouring, laser texturing and patterning, and wafer mapping. These features make P15 an excellent choice for wafer testing and metrology applications.