Used KLA / TENCOR P15 #9302999 for sale

KLA / TENCOR P15 is a wafer-level testing and metrology equipment. It is capable of inspecting and analyzing both the electrical and physical characteristics of semiconductor devices. It is used in the production of integrated circuits, flat panels, and other electronic components. KLA P-15 features a unique, integrated system design and is able to handle a variety of wafers up to 8 inches in diameter. The unit is equipped with a high-speed light source, optical path, and monitoring machine, as well as a robust software package. Its repeatability and accuracy ensures reliable performance and accurate results. TENCOR P 15 tool supports wafer testing for a range of applications, such as critical dimensions, film parameters, yield management, high- and low-frequency electrical performance characterization, and electrostatic discharge (ESD) testing. The integrated optical subsystem of P15 provides high-precision optical metrology capability. This feature is enabled by an advanced, wide field of view opto-mechanical asset powered by precision servo motors, and top end imaging instruments. It is designed for wafers up to 8 inches in diameter, and is capable of measuring both wafer thicknesses and film thicknesses. The integrated optical subsystem also provides the ability to acquire and validate resistivity and thickness maps, enabling the operator to identify deviations that require further action. KLA / TENCOR P 15 is equipped with a powerful suite of defect inspection tools, InspectNUX and TVSight, which are capable of detecting and locating isolated and buried defects on the wafer surface. It also provides comprehensive design-for-test (DFT) analysis reporting capabilities, and includes remote management capability. Finally, P 15 is equipped with visual data analysis capability. This allows the operator to easily analyze complicated images using the provided program, providing the user with a detailed and accurate report of their findings. In summary, KLA P15 is a wafer-level testing and metrology model designed for production and research applications. It provides accurate and repeatable performance and is ideal for multiple wafer testing and metrology applications, including DFT, electrical performance characterization, and defect detection. Utilizing its advanced optical subsystem and integrated software package, TENCOR P-15 is a reliable and powerful tool for manufacturing semiconductor components.