Used KLA / TENCOR P15 #9306139 for sale

KLA / TENCOR P15
ID: 9306139
Vintage: 2001
Surface profiler 2001 vintage.
KLA / TENCOR P15 is a wafer testing and metrology equipment designed to be used in the semiconductors and integrated circuits manufacturing industries. It is used to detect and analyze defects on semiconductor wafers and provide results to the engineering team. KLA P-15 system enables wafer examination with a high resolution imaging unit and the ability to measure sample size and defect size precisely. It is equipped with a high-resolution imaging machine that captures sample images and performs a range of rigorous tests. This tool utilizes optical and infrared imaging and spectroscopy as well as detection. In order to test a wafer, TENCOR P 15 uses laser beam technology and proprietary algorithms that add to the asset's precision. The algorithms help the model to differentiate between different defects and separate them from normal and acceptable values. The equipment can also measure wafer flatness and thickness with high accuracy. Additionally, by utilizing advanced laser interferometry the system is able to detect defects submicron in size. P-15 has an extremely fast cycle rate of one second, which allows it to handle high-throughput production lines. This unit has dual, gantry-mounted stages and is capable of operating on 24 different autoloaders at the same time, giving increased flexibility. This high throughput capability as well as its capability to detect ultra-small defects makes TENCOR P15 an ideal choice for complex wafer testing needs. KLA P 15 employs a variety of metrology tools, including CCD imaging, optical reflectometry, multiple spectroscopy methods and AFM imaging. This allows the machine to analyze different features such as grain size and shape, surface roughness, and composition, making it ideal for a range of wafer testing needs. KLA P15 also provides accurate data analysis. The tool includes advanced model-based defect classification (MODCAL) algorithms which automatically detect and classify defects according to their characteristics. This helps reduce false positives, making it easier for professionals to interpret data and make smart decisions with confidence. In conclusion, P15 is a reliable and precise wafer testing and metrology asset that can help ensure the reliability of products with its precise defect detection and analysis capabilities. The model's high throughput capability and fast cycle rate of one second make it an ideal choice for high volume production lines, and the advanced technology it utilizes makes it the perfect equipment for complex wafer testing needs.
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