Used KLA / TENCOR P15 #9315027 for sale

KLA / TENCOR P15 wafer testing and metrology equipment is designed for fast, efficient, automated testing and inspection of semiconductor materials and products. Utilizing an automated optical inspection solution, the system is capable of detecting potential defects, such as micro-cracks, particles, and other flaws. KLA P-15 integrates special imaging, illumination, and analysis technologies to quickly capture images of wafer surfaces and analyze them. The unit includes proprietary feature recognition algorithms that help identify and measure difficult-to-detect objective characteristics. Additionally, TENCOR P 15 incorporates a suite of precision metrology tools and advanced measurements. These tools enable a precise and precise measurement of wafer topography, dimensions and other materials properties, such as flatness and profile. These measurements are essential for maintaining the precise dimensional requirements necessary for success in the semiconductor industry. Furthermore, P15 is composed of high-precision sensors, which capture precise data from wafers surface profiles. This allows for accurate measurement of feature sizes, distances, surface topography, and many other surface characteristics. P-15 also provides powerful software tools for analyzing, sorting, and reporting results. The software's analytics capabilities enable detailed defect classification, data inspection, and statistical summary reports. The machine is capable of storing, analyzing, and reporting vast amounts of data. The reporting capabilities enable users to present the information to the customer in a meaningful way. KLA / TENCOR P 15 provides automated defect sorting, reporting and defect management capabilities, which enable inspection efficiency increases while decreasing data management costs. Additionally, TENCOR P-15 includes a connection to KLA online defect management tool. This allows users to access defect data remotely, and to share and collaborate on data securely. All in all, KLA P15 wafer testing and metrology asset is an integral tool for measuring, inspecting, and analyzing semiconductor materials and products. With powerful imaging technologies, metrology tools, analytics, and reporting capabilities, KLA P 15 offers users a reliable, efficient solution to their wafer testing needs.