Used KLA / TENCOR P15 #9315028 for sale

KLA / TENCOR P15 is a wafer testing and metrology equipment designed to provide highly accurate and reliable data. This system is ideal for product development, research and development, failure analysis, process control, and process development applications. It is a fully automated, multi-functional unit that is specifically designed to address the testing, analysis and characterization of semiconductor wafers. KLA P-15 machine integrates several technologies in order to provide comprehensive and accurate information quickly. It is equipped with advanced image analysis and real-time pattern recognition algorithms to facilitate rapid material classification, defect and critical dimension measurements with precision. Additionally, it combines optical, electrical, and acoustic metrology capabilities to accurately characterize device features, as well as wafer and circuit materials and parameters. The tool has a reliable defect detection capability with high accuracy to meet the stringent requirements of both production testing and research and development applications. It utilizes multiple analytical tools, including microscopy, tunneling electronic microscopy (TEM), scanning acoustic microscopy,and two-stage spectroscopy. In addition, the asset has a dynamic range for high-resolution imaging, allowing for the detection of even the smallest defect. Furthermore, TENCOR P 15 also provides highly reliable inspection of pattern edges, as well as accurate growth measurements of dual pattern structures. The model includes a high-end PC with a 21-inch touch monitor and a multiprocessor CPU to support faster wafer testing and analysis times. It also incorporates various robotic and automated processes to minimize hands-on time, reduce manual errors and provide data efficiently. P 15 also includes a range of image analysis, software, and data processing programs. It has the capacity to perform a variety of processes including positive-tone and negative-tone film thickness measurement, optical scattering analysis, alloy composition analysis, layer-to-layer registration verification, and micro-structure analysis. Additionally, the equipment provides a suite of features, such as statistical process control, root cause analysis, yield management, and fault identification for further quality assurance. In summary, TENCOR P15 system provides an economical solution for high-value process control, verification, or failure analysis applications, as it offers a variety of automated and reliable testing and metrology capabilities. It can provide substantial improvement in wafer characterization, quality assurance, and yield management.