Used KLA / TENCOR P15 #9374775 for sale

KLA / TENCOR P15
ID: 9374775
Surface profiler.
KLA / TENCOR P15 is an innovative wafer testing and metrology equipment that offers fast, accurate, and repeatable results. The system is designed to meet the demands of today's advanced technologies, providing quality data with minimal downtime. The unit combines the latest optical technologies, precision mechanical engineering, and software algorithms to provide reliable and consistent performance at high throughput speeds. KLA P-15 utilizes Optical Profiler Scanning (OPS) technology to measure and analyze wafer shape and profile. OPS enables fast, accurate dimensional measurements and profile analysis. The machine is optimized for semiconductor wafer metrology, providing high-resolution 3D scans and superior repeatability for improved data accuracy. The tool integrates an automated tool changer to seamlessly transition between toolsets, allowing users to switch from a shape-measuring tool to an electrical-characterizing tool, while maintaining accuracy and data integrity. TENCOR P 15 has an automated vacuum handling asset which simplifies the entire process. An optical imaging model provides 2D and 3D imaging and characterization at 5kHz data transfer rate. It also includes an integrated automation software that eliminates manual programming and offers automated defect inspection, sample management, and real-time optimization options. P 15 is a compact, lightweight equipment that takes up minimal space on the benchtop. It is backed by a robust quality assurance system and is built to the most rigorous manufacturing and testing standards. The unit features intuitive operation and quick setup and operates at high speeds and throughput rates. Overall, KLA P 15 Wafer Testing and Metrology Machine provides reliable and repeatable results, enabling the production of advanced wafer systems. It is an excellent choice for high-volume production lines and is designed for consistent, reliable performance even under the most demanding conditions.
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