Used KLA / TENCOR P15 #9379429 for sale

ID: 9379429
Surface profiler.
KLA / TENCOR P15 is a fully automated, high throughput wafer testing and metrology equipment featuring advanced technologies for production and laboratory requirements. It is designed to enable fast testing, accurate analysis, and faster time to market for Companies. KLA P-15 offers leading-edge algorithmic techniques and hardware to deliver faster test times and improved productivity. The system is equipped with advanced tools to enable the efficient analysis of test data and faster time-to-market. TENCOR P 15's Test Manager software provides a comprehensive platform for automated test sequence programming and data analysis, further reducing test time. Additionally, the unit can perform both physical and statistical analysis for real-time classification to support quality assurance. The machine also incorporates advanced metrology capabilities to provide detailed images of microelectronic components such as integrated circuits (ICs) on a wafer. TENCOR P-15's Optical Metrology Tool (OMS) enables the mapping of these critical features in 3D-Space to meet customer's design requirements. This integrated mapping technology accelerates wafer probing and increases throughput. The asset is designed to withstand harsh industrial environments and stringent requirements of quality assurance. It features robust processing chambers and a fully modular design, making it easy to access and maintain. The environmental control model maintains a stable temperature and humidity ensuring reliability, while the test doors and hatches protect the equipment from heavy particles and dusts, providing a clean and safe environment. TENCOR P15 is also equipped with advanced safety features that protect personnel from shocks and other safety risks. Its advanced safety equipment includes this ionized monitor to detect flammable gases and notify personnel for the safe evacuation, providing a safe and secure working environment. Overall, P 15 is a powerful and advanced system for wafer testing and metrology. It delivers faster test times, improved accuracy, and improved efficiency in testing and metrology. Its powerful and more advanced tools help Companies reduce time spent on test development and data analysis and provide them with rapid time to market. In addition, its enhanced safety features ensure a safe working environment and reduce operational costs.
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