Used KLA / TENCOR P15 #9388404 for sale

ID: 9388404
Surface profiler.
KLA / TENCOR P15 is a wafer testing and metrology equipment that is designed to provide advanced wafer automation and fast, accurate inspection. It is capable of scanning both the top and bottom sides of a wafer, which allows for improved detection of contaminants or defects. This system is equipped with a 5-axis motorized stage, which allows for higher precision during the scanning process and allows for faster, more accurate inspection. The unit is also outfitted with advanced imaging technology, including 3D, color and white light, which helps with the inspection process. KLA P-15 machine also enables advanced analysis with its advanced analysis tools. It includes the High Resolution PixelMap (HRPM) feature, which uses deep learning algorithms to analyze wafer images and detect even the smallest of defects and particles. Furthermore, the tool also provides specialized software options to facilitate automated analysis, such as the Advanced PixelMap Analysis (APMA) tool and the EdgePixel Detection (EPD) tool, which are designed to detect edges, edges/contours, and layer-like defects, respectively. TENCOR P 15 asset offers a wide range of additional features that make it an ideal choice for wafer production. It is capable of inspecting a wide range of wafer sizes, from 1" to 8" in diameter. Additionally, it is also equipped with an advanced reporting model that allows for better data management and tracking throughout the testing and metrology process. Finally, KLA / TENCOR P-15 offers a robust design that is resistant to shock and vibration, which ensures the equipment will remain stable and accurate even under harsh environmental conditions. This ensures that the system is able to reliably perform testing and metrology tasks to a level of accuracy, regardless of the environment in which it is used. In conclusion, KLA / TENCOR P 15 is a highly advanced wafer testing and metrology unit that is designed to provide high resolution imaging, precise inspection, and automated analysis. Its robust design ensures stability and accuracy in even the toughest of conditions, making it a dependable choice for wafer production.
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