Used KLA / TENCOR P15 #9401373 for sale

KLA / TENCOR P15 is an integrated wafer testing and metrology equipment designed by the major manufacturers, KLA Corporation, to provide significantly improved performance in the fabrication of advanced semiconductor integrated circuits, as well as increased manufacturing yields. This system has been engineered to provide automated analysis of a wide variety of integrated wafers, including those found in memory, logic, optical and other complex structures. The unit leverages the effective use of high-accuracy laser interferometry, defect imaging, and advanced defect analysis. Its commercially available platform includes an optical microscope, an interferometric microscope, an automated wafer inspection and alignment machine, and a range of advanced metrology modules, including those focused on die-level and wafer-level yield analysis and variations. The tool is designed to provide accurate data capture from a wide variety of wafer surfaces at the chip-level. KLA P-15 offers a complete package for testing, alignment, defect inspection and analysis, as well as precision scan measurements. This asset provides a high degree of accuracy and repeatability (with repeatability better than 0.1um) for all type of integrated circuits and processes. The model is used for automated optical and interferometric inspection, including the generation of high-resolution images and measurement of surface dimensions. It also has the capacity to perform automated die-level defect inspection and yield analysis, as well as wafer-level performance monitoring. Additionally, the equipment is capable of performing automated alignment of the wafer under test, allowing for the accurate measurement of relative die and chip position. This helps to ensure that all parts of the wafer are regularly tested and evaluated accurately. TENCOR P 15 ultimately provides a unique suite of advanced tools for data analysis and evaluation. This includes the output of detailed resultsets, enabling users to perform accurate failure analysis and gain a better understanding of the root cause of defects. The system has been highly successful in providing quality control and increasing manufacturing yields across a variety of integrated circuit processes. It has been used by industries such as medical, military, communications, and automotive. As a result, TENCOR has become the gold standard in wafer testing and metrology.