Used KLA / TENCOR P16+ #293765625 for sale

KLA / TENCOR P16+ is a equipment designed for high-throughput wafer testing and metrology. It has four distinct components that allow for precise measurement of different properties on silicon wafers. The first part of the system consists of a vision unit that is used to identify and measure the position of a wafer pattern or defect. This machine utilizes a precise laser for proper alignment and is equipped with a high-resolution digital camera that can detect patterns or defects from the wafer surface. This tool also includes an optical microscope to optimize accurate focus and acquire high-quality images. The second part is the Metrology Station which uses the collected data from the vision asset to accurately measure wafer properties. This station is integrated with advanced optical software tools to measure wafer features such as lines, flares, and voids. It also features a non-contact optical technique called Photometric Stereo (PS) which is used to construct a 3-dimensional representation of the surface in order to determine individual topography and surface imperfections. The third part is a High-Speed Mapping Model used to quickly create a mapping of up to 100 individual patterns or defects. This equipment is extremely efficient, allowing it to quickly scan large wafers with high resolution. It is also equipped with statistical tools to analyze the data acquired and provide reliable results. The fourth and final part of the system is an Automated Defect And Scratch Inspection Unit (ADSI). This machine uses laser optics to inspect a wafer for any defects or surface scratches that may affect the process. This tool includes sophisticated image processing algorithms to detect and classify any defect. Overall, KLA P 16+ is a versatile asset for wafer testing and metrology. Its components provide precise wafer feature and defect measurements, enabling quick and accurate results. Its robust design and powerful software tools make it a reliable model for any wafer testing process.