Used KLA / TENCOR P16+ #293778035 for sale

KLA / TENCOR P16+ is a high-end wafer testing and metrology equipment designed for optimal process control and rapid yield ramp. It provides wafer-level parametric testing and mapping capabilities while enabling precision metrology based on dual-layer CCD imaging technology. The system is equipped with advanced image processing algorithms and a wide array of features to ensure accurate and reliable analysis. KLA P 16+ integrates a range of test technologies, including optical inspection, integrated circuit testing, parametric test, hybrid test, and partial wafer test. It is also equipped with an auto-focus yield map to ensure accuracy and reliability while efficiently mapping variations in substrate thickness, uneven surfaces, and other surface features. This auto-focus unit also provides mechanical alignment, optical metrology, and inspection of features such as cracks, scratches, and particles. TENCOR P-16+ machine includes a high-performance CCD camera, advanced illumination tool, and multi-component illumination heads. The illumination asset includes spotlights, line-scan lasers, and a variety of advanced illumination techniques to provide exact mapping of features on the wafer. The built-in software capabilities allow for automatic alignment, mapping, defect detection and classification. P 16+ offers a high-precision wafer test package that can be customized according to the customer's requirements. With the addition of various test modules, the model provides comprehensive testing of all layers of customer-defined interconnects on a single wafer. This includes visual imaging and metrology of the wafer backside and application-specific functionality such as particle metrology, multiple die testing, optical micro-image processing, and etch-depth measurement. With KLA P16+ equipment, users can easily set up testing parameters, perform on-the-fly calibration, and view test data, all via a centralized control panel. TENCOR P16+ system also provides comprehensive process control functionality, allowing operators to track and easily monitor trends in wafer performance. The unit helps to ensure optimal yield and quality of wafers by providing advanced process control, real-time monitoring, and quick test feedback. All of these features combine to ensure that customers receive the best wafer testing and metrology machine available.