Used KLA / TENCOR P16+ #293816815 for sale

KLA / TENCOR P16+ is a high-performance wafer testing and metrology equipment designed to inspect and characterize a wide range of wafer characteristics for wafers up to 200 mm in diameter at high throughput and accuracy. It combines unparalleled accuracy, speed, and accuracy across a wide range of process and metrology applications including wafer defects, overlay, patterning, contamination, and etch. KLA P 16+ features revolutionary new optical metrology hardware and software technology that allows the system to effectively inspect and characterize wafer features with size, height, depths, and angles that are both below and above the nanometer scale. TENCOR P-16+ utilizes unique multiscale metrology and auto-alignment technology for optimal metrology accuracy across a range of wafer sizes. KLA P16+ includes an advanced, user-friendly graphical user interface that enables operators to perform a wide range of operations quickly and accurately. KLA / TENCOR P 16+ unit's test capabilities include low kV defect inspection, die-to-die overlay metrology, resist edge dimension metrology, line edge roughness, multiple resist line patterning, critical dimension, and focus-tuned reflectivity. It also uses unique, proprietary algorithms to analyze the results to accurately measure and characterize a wide range of wafer characteristics. P16+ also offers a number of advanced features for process characterization and optimization, including Line Edge Roughness (LER) metrology, which can provide detailed information regarding line edge structure for processes related to lithography, and Automated Defect Detection (ADD), which can detect defects in both the image and on the device with an unmatched defect sensitivity. TENCOR P 16+ machine includes various options to accommodate various applications and configurations. These include specialized wafer tester and handler robotics, customized calibration options, accessories such as focus calibration plates, and the ability to run user-defined, custom test sequences. In summary, KLA / TENCOR P-16+ is an advanced, high-performance wafer testing and metrology tool that is capable of inspecting and characterizing wafers up to 200 mm in diameter with speed and accuracy. It combines revolutionary optical metrology hardware and software technology, proprietary algorithms, and powerful, yser-friendly graphical user interface to consistently produce reliable results across a wide range of process and metrology applications. TENCOR P16+ offers specialize wafer tester and handler robotics, customization options, and the ability to run user-defined, custom test sequences to further enhance its capabilities.