Used KLA / TENCOR P16+ #9364779 for sale

KLA / TENCOR P16+ is a highly advanced wafer testing and metrology equipment that is used for process optimization and defect inspection. KLA P 16+ is designed to collect comprehensive measurements of a wafer's parameters and characteristics. It uses a load lock, automated wafer handler and integrated metrology capability to measure critical parameters such as critical dimension (CD), defect inspection and overlay alignment, as well as other process performance metrics. TENCOR P-16+ incorporates a proprietary high-resolution optical system that enables precise non-contact and non-destructive measurement of critical parameters such as CD and overlay. This unit allows operators to resolve 0.5 mm or less CD variation on the wafer surface, which is significantly beyond the sensitivity of other metrology systems. In addition, KLA P16+ offers a real-time machine for efficient defect inspection, and is able to detect extremely small defects and particles in real-time with its high sensitivity and resolution. TENCOR P16+ also features an advanced thermal imaging tool to provide accurate temperature control of the wafer during testing, as well as a special alignment algorithm for measuring overlay performance. This asset also provides a fast, high accuracy alignment solution for critical features. An automated wafer handler supports various wafer sizes from 8-inch to 12-inch, with a unique design to ensure precise alignment and handling. Overall, P 16+ is an ideal solution for optimizing processes and ensuring consistent quality assurance. It is designed to streamline processes while improving detection sensitivity and accuracy. KLA / TENCOR P 16+ allows operators to quickly and accurately test wafers, and to monitor process stability. It is a highly versatile and reliable tool for advanced metrology applications.