Used KLA / TENCOR P16+ #9395529 for sale

KLA / TENCOR P16+ is a wafer testing and metrology systems developed by KLA Corporation, a leading provider of metrology and inspection solutions. KLA P 16+ equipment provides advanced 2D metrology and imaging capabilities for semiconductor wafer process monitoring, characterization, and failure analysis. It offers extended process coverage to ensure optimal yields in all phases of the chip fabrication process. TENCOR P-16+ system is designed for high-volume metrology, imaging, and analysis to support process optimization of low temperature devices. It is designed with an integrated metrology platform combining 3D scanning capabilities with optical, spectroscopy, and electrical measurement solutions. The unit features an advanced suite of tools for the determination of wafer plane parameters such as profile, flatness, and layer thickness. KLA / TENCOR P-16+ machine enables automated measurement of process behavior at the wafer level and offers enhanced throughput and measurement capabilities for both single- and multiple-die implementations. Its advanced Optimized Defect Detection (ODD) and Image Recognition (IR) algorithms facilitate rapid evaluation of process defects to help detect any quality issues before they can create a yield loss. TENCOR P 16+ tool is also designed for reliability and repeatability throughout the production process. It meets strict production requirements with specialized algorithm for critical dimension (CD) measurement and metrology, enabling fast and efficient process evaluation. The asset allows cross-site monitoring and reporting of any process issues, helping to ensure that variability is kept to a minimum. KLA P16+ model provides comprehensive data analysis and reporting capabilities with the advanced TENCOR FabOptimizer suite of software products. The FabOptimizer suite offers real-time analysis of process and device data to help identify and address any issues that may arise. It offers integrated quality dashboards that enable rapid process optimization through alert management and parameter tracking. The equipment also provides site/function/discrete data mining capabilities to allow for more in-depth process analysis. Overall, P16+ is an advanced metrics, imaging, and analysis system designed for robust wafer testing and metrology. Its integrated metrology platform provides comprehensive process coverage, automated measurement, enhanced metrics, and reliable repeatability capabilities. With advanced data analysis and reporting capabilities, TENCOR P16+ unit helps to ensure yield control and process optimization in wafer fabrication.