Used KLA / TENCOR P16+ #9395553 for sale

KLA / TENCOR P16+ Wafer Testing and Metrology System is a comprehensive, digital platform for testing and metrology in the semiconductor, nanotechnology, and MEMS industries. This integrated platform provides the reliability, accuracy, and performance required for in-line metrology, critical dimension (CD) measurement, and yield management. The core components of KLA P 16+ are the OptiCAD™ laser displacement sensors and the high-resolution optical assembly. To maximize accuracy and reliability, these components use a combination of technologies, such as imaging processing, image recognition, profile fitting, masking, and data fusion. The OptiCAD™ laser sensors are designed to capture complex device topography data accurately and reliably. Featuring advanced signal-to-noise-ratio performance, they are able to precisely map out device features with resolutions up to 1 micron. This allows for the measurement of dimensions in 2D, 3D, and 4D. The high-resolution optical assembly enables real-time image recognition and layer imaging, enabling highly accurate metrology across the entire surface of the wafer. The optical assembly is able to capture images in high-definition, providing the best possible resolution for both surface scans and imaging. With the ability to scan wafers up to 17-inches in size, TENCOR P-16+ can measure devices like large flat panels and displays. In addition, P16+ features powerful algorithms for data analysis. These algorithms can identify patterns, detect trends, and isolate defects to ensure yield control and quality assurance. The system also comes with a full suite of software tools to enable efficient data visualisation and analysis, making it easy to diagnose and troubleshoot issues as they arise. Designed for superior operational efficiency and reliability, KLA / TENCOR P-16+ can be employed in wafer testing and metrology applications in the lithography and device characterization markets. The system offers uncompromising performance, with built-in fail-safes and accurate real-time measurements to guarantee the highest levels of accuracy, repeatability and efficiency.