Used KLA / TENCOR P16+ #9398371 for sale

KLA / TENCOR P16+ is an advanced wafer testing and metrology equipment designed for both production and research applications. It has the capability to measure a wide range of parameters and features, quickly and accurately, enabling sophisticated process control and development. The system is capable of working with a wide range of materials, from GaAs to Silicon, and enables pattern and overlay measurements with statistical results available in minutes. The unit has a 16-inch field of view, with a maximum 2µm resolution across a range of 4µm in height. The machine can also measure film thickness, configuration and other parameters included in the wafer profile. In addition to its core scanning and processing capability, KLA P 16+ has an integrated fastback scanner for high productivity. This scanner enables the measurement of high-resolution surface features, enabling wafer inspection and measurements that could previously only be done through destructive processes. TENCOR P-16+ can be integrated with various other systems, such as lasers and optics, for extended capabilities. In Research mode, the tool is designed to allow the in-asset measurement of patterning and modification of various processes, greatly increasing the flexibility of the model. The equipment is designed with a number of automated features, such as Autopilot for high volume throughput, and Auto Meter for automated inspection of wafer parameters. Overall, P 16+ is an impressive wafer testing and metrology system. It offers users a sophisticated and high-performance unit with a range of integrated features that can optimize every step of the process, from substrate inspection to development. It is an ideal choice for precision measurement and process control in both production and research environments.