Used KLA / TENCOR P17 OF #293666751 for sale

KLA / TENCOR P17 OF wafer testing and metrology equipment is a high-end metrology system used for the inspection of wafer substrates used in the semiconductor industry. The unit utilizes a combination of advanced evaluation and metrology techniques, including full-field imaging, automated defect review, and focused ion-beam analysis to provide a detailed, comprehensive view of wafer substrates. KLA P17 OF machine consists of several modules including an infrared optical scanning subsystem, a 5 megapixel camera tool, and a high-efficiency, low-power ion column. The infrared optical scanning asset enables full-field imaging, providing a detailed, high-resolution image of the entire wafer. The camera model allows for automated defect review, providing a rapid, reproducible review of process-related defects on the wafer. The ion-beam column provides unparalleled analysis of localized regions of interest on the wafer for further evaluation of process-related defects. In addition to the imaging and metrology components, TENCOR P17 OF also includes an automated wafer staging equipment that offers a highly-configurable wafer preparation and handling process. The staging system allows for accurate, repeatable positioning of the wafer and automated alignment with the imaging and metrology components. P17 OF is designed with a fully-integrated image capture, processing, and display unit, offering operators an easy to use graphical interface. The intuitive user interface provides operators with a comprehensive view into all areas of the metrology operations. The machine can store data from previous runs, allowing operators to quickly recall and analyze runs for analysis and comparison. KLA / TENCOR P17 OF is designed to meet the demands of the latest semiconductor process technologies and offers cutting-edge performance and measurement capability. The tool is ideal for mask to mask process development, process control, and quality assurance applications. The asset provides unparalleled accuracy and reliability, providing reliability assurance to semiconductor process engineers in the most advanced technology nodes.