Used KLA / TENCOR P17 #293629793 for sale

KLA / TENCOR P17 is an automated wafer testing and metrology equipment designed for high-volume production applications. It combines the data accuracy of optical metrology and the high speed of electrical tests to ensure consistent, accurate results. The system is capable of defect inspection, metrology and parametric testing, as well as probing, wafer level and component level testing. At the heart of the unit is the powerful KLA P-17 optical inspection tool that uses advanced proprietary algorithms to detect even the most challenging defects. It can detect open, short, thin film, solder-paste, and other micro-structural defects on 100mm to 300mm wafers. It also includes powerful autofocus algorithms to ensure precise wafer inspection, top-level detection accuracy, and minimal false alarms. TENCOR P 17 has a high-speed size scanner feature that enables quick testing of the entire surface of the wafer in less than a second. Its built-in measurement features can measure resistivity, reflectivity and surface morphology. KLA P17's advanced live-view portfolio architecture consists of several modules designed to optimize test time and accuracy. This architecture provides high-speed-scalability and flexibility, allowing the machine to handle different test types simultaneously. The high-performance, multi-axial, high-efficiency-locking probe approach also ensures precise repeatability and faster execution. In addition, P17's patented probe-module technology reduces contact force by one hundredth of the force used on standard probes, ensuring long-term reliability. KLA / TENCOR P 17's modular design and a wide range of peripheral instruments allow it to be configured to meet the needs of any production environment. A built-in flexible and programmable Autostrobe calibration tool compensates for any changes in illumination, ensuring that the asset's samples are equally illuminated. P 17 is capable of handling a range of tests, including electrical tests, physical-structure tests, and optical metrology. In addition, the model's sophisticated data analysis software helps engineers interpret measurements, quickly identify and solve wafer-level problems, and create advanced test designs. By combining high-precision optical measurements, high-speed electrical measurements, and advanced analysis algorithms, TENCOR P-17 offers an unprecedented level of testing and metrology capabilities.