Used KLA / TENCOR P17 #293824839 for sale

KLA / TENCOR P17 is a powerful, autonomous wafer testing and metrology equipment specifically designed for automated metrology of wafer structures. The system consists of two core components: the main metrology unit and the Sample Packaging and Control Unit (SPCS). KLA P-17 provides automated, high-precision metrology for 300mm, 200mm and 150mm wafers. The main metrology unit is a precision scanning stage that allows wafers to be accurately aligned and then shot using a hyperspectral imaging technique. The scanning stage is positioned and operated by a high-speed, low-noise linear servo-motor that can be configured to scan a specific range of wafers, as well as to adjust its speed for optimal performance. This scanning machine utilises advanced CCD/CMOS sensors and a vibration-dampened scanning stage to ensure high-resolution analysis with repeatable accuracy. TENCOR P 17 also includes an advanced Sample Packaging & Control Tool (SPCS) for sample preparation and control. The SPCS combines several components that allow for fast loading and unloading of multiple wafers, sample mapping and alignment, as well as storage and retrieval of wafer metrics. The SPCS can securely package multiple wafers that are then sealed and transported to the metrology unit. Additionally, the SPCS includes a specialized temperature control that allows for temperature-dependent wafer measurement. KLA P17 asset utilises advanced software for image acquisition, analysis, and reporting of wafer results. This software provides high accuracy measurements and offers a range of tools and views for data analysis. Additionally, KLA / TENCOR P-17 allows the user to easily define custom analysis suites and report formats, which enables faster troubleshooting and more efficient wafer analysis. To ensure quality and accurate results, P17 model includes multiple levels of redundancy and a reliable data management equipment. This system ensures that the overall unit uptime is maximized and that wafer test results are securely stored and backed up in the event of machine failure. Overall, P 17 tool provides automated, flexible, and accurate metrology for wafer processing. Its combination of advanced metrology technologies, sample packaging and control, customisable analysis tools, and robust data management capabilities make TENCOR P-17 an essential tool for any wafer processing facility.