Used KLA / TENCOR P2 #293595754 for sale

KLA / TENCOR P2 is a wafer testing and metrology equipment used for analyzing semiconductor wafers. It is a highly integrated system for measuring and assessing the topographical and electrical characteristics of semiconductor wafers. KLA P-2 includes a high-speed image sensor to capture topographical features of the wafer, a powerful image processor to analyze the captured data, and several other sensors to measure the physical properties of the wafer, such as its resistivity. The image sensor included in TENCOR P 2 is an advanced array of charge-coupled devices (CCDs) capable of capturing large areas of the wafer surface. The large format allows for the collection of more data points across the wafer and ensures that data points are collected more rapidly. The image processor is capable of quickly and accurately analyzing the captured image data, identifying defects, and creating a detailed topographical map of the wafer surface. The processor also provides metrology capabilities, calculating various performance parameters of the wafer such as its voltage, resistivity, and thickness. In addition to the image sensor and processor, P-2 includes an array of specialized sensors for measuring various electrical and physical properties of the wafer. These include KLA VFET sensor, an advanced electrical performance tester, the perimeter guard scanner, a contact resistance map scanner, and the probe unit, an array of probes for measuring properties such as resistivity, flatness, and surface uniformity. KLA P 2 also includes a vision machine for visual inspection of wafers. P2 is highly automated and capable of performing a variety of tasks in a single session. It can measure electrical performance characteristics such as voltage, current, resistance, capacitance, and inductance. The tool also has the ability to measure and analyze the profile, thickness, and surface quality of the wafer, as well as its flatness and surface uniformity. The breadth of features and functionality offered by KLA / TENCOR P-2 make it an invaluable tool for the analysis and evaluation of semiconductor wafers. Its highly automated nature allows for rapid measurement and assessment of the wafer's electrical and physical characteristics. The data collected by P 2 can then be used to make strategic decisions and create process changes that will improve semiconductor manufacturing.