Used KLA / TENCOR P2 #9009073 for sale

ID: 9009073
Wafer Size: 8"
Surface profiler, 8".
KLA / TENCOR P2 is a wafer testing and metrology equipment for a wide variety of semiconductor analysis. KLA P-2 system from KLA is a high-precision tool for device characterization that helps lower cost and time-to-market for the analysis of semiconductor materials. TENCOR P 2 unit features an integrated platform with a suite of focused measurement capabilities and intuitive software for precise measurement of the size, shape and composition of materials, including characteristics such as resistivity, sheet resistance, mobility, breakdown voltage, film thickness, and critical dimension measurements. P-2 machine is designed with a high-speed alignment tool to automatically align the sample wafer to the inspection area with accuracy and high throughput. This allows TENCOR P2 asset to quickly and accurately measure various characteristics of the sample, including critical dimensions, sheet resistance profiles, mobility characteristics, and resistivity measurements. KLA P 2 model's integrated platform includes an array of technologies, like laser interferometry and scatterometry, designed to generate highly precise physical and chemical measurements, providing the customer with a tremendous amount of detailed information about their device. This integrated platform allows for multiple dimensions of analysis, as well as ancillary measurements for deeper understanding of the processes. The user-friendly TENCOR P-2 software provides powerful analysis tools such as statistical and historical analysis. It allows operators to customize jobs through parameter setting, focusing, and data processing, allowing for an easy-to-use yet powerful platform. With three different levels of operation, from raw data to custom process development, P 2 equipment is an indispensable tool to enable your production processes to operate with the highest possible accuracy and repeatability. Overall, KLA / TENCOR P 2 provides an efficient, integrated solution for wafer testing and metrology, allowing users to get accurate, detailed results quickly and easily. With its suite of advanced measurement capabilities and intuitive software, KLA / TENCOR P-2 system is a reliable, industry-leading solution well-suited for a variety of device characterization tasks.
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