Used KLA / TENCOR P2 #9163528 for sale

ID: 9163528
Wafer inspection system.
KLA / TENCOR P2 is a wafer testing and metrology equipment developed for the semiconductor industry. It is designed to provide accurate measurements of process variables on a variety of sample materials, such as GaAs, SiGe and SiC wafers, as well as MEMS and nanoscale imaging samples. It is capable of performing measurements across both physical dimensions and electrical characteristics of semiconductor substrates. The system uses a combination of high-resolution imaging, deep-trench etching, integrated optical diagnostics, and an onboard computer to measure detailed parameters of wafers such as topography, surface morphology, doping, resistivity, and specified electrical conductance. The unit is capable of taking high-resolution images of the wafer and providing detailed physical and electrical parameters of the wafer at the same time, simplifying the process of measuring and characterizing wafers. The machine is equipped with advanced software and hardware interface technologies that allow for easy integration into existing fabrication infrastructures. This includes features such as an Ethernet port, intelligent host control and a suite of image analysis software. The tool is capable of measuring a variety of process variables to measure electrical characteristics such as capacitance, impedivity, phase-shifting, and impedance. The asset is designed for high throughput and accuracy and is capable of performing in-depth analysis of many different types of semiconductor components in a single analysis session. It is also equipped with advanced calibration and calibration management capabilities and allows for measurements of small feature sizes. The mathematical algorithms used by the model allow for very accurate calculation of electrical characteristics and performance data for accurate measurement and analysis. In addition, the equipment supports the latest statistical process control (SPC) methods and can be used to spot product process variations and take corrective action quickly. The software that accompanies the system enables data analysis, report generation and close monitoring of process variables. Overall, KLA P-2 is an advanced wafer testing and metrology unit designed to provide accurate measurements of process variables on a variety of semiconductor components. It is built on advanced imaging and analysis technologies and is ideal for conducting in-depth analysis of wafers and other components. The machine is highly customizable and offers a wide range of features for statistical process control and accurate measurement of electrical characteristics.
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