Used KLA / TENCOR P2 #9205754 for sale

ID: 9205754
Wafer Size: 6"
Surface profiler, 6".
KLA / TENCOR P2 is a wafer testing and metrology equipment used to inspect and analyze wafer topography. The system provides a combination of automated optimization and failure analysis for quick and clear results. It is the most advanced wafer metrology unit available today, and uses a unique imaging and pattern recognition technology to acquire precise 3-dimensional measurement data. KLA P-2 imaging machine uses advanced imaging technology, such as an ultraviolet microchannel plate, electron beam column, and electron optical column. The resulting images are analyzed, compared with reference structures, and correlated to develop detailed wafer topographies for automated defect detection. The tool also includes an automated wafer inspection process, which allows wafers to be inspected quickly and accurately. The asset is equipped with a meteorological chamber with an adjustable temperature and humidity range to accurately measure the feedback from the wafer surface. TENCOR P 2 metrology model features a set of advanced software tools for data analysis, Statistical Process Control (SPC), and data visualization. The SPC software can detect trends such as variations in wafer surface topography and irregularities in test results. The data visualization software gives an overview of the data gathered during the test, allowing analysts to create intuitive and informative diagrams with ease. KLA P2 equipment also features a high speed, low energy ultrasound signal generator, which is used to analyze data at a high resolution. This allows for a precise analysis and measurement of defects on the wafer surface. The system is also equipped with a laser interferometer, which can measure the flatness of the wafer's surface, as well as any defects in the wafer topography. The overall architecture of P2 platform is designed for automation, flexibility and scalability. It is a robust metrology unit that can handle multiple tests, multiple wafers, and multiple process conditions. And, because the machine is fully customizable, it can be tailored to specific customer needs. All of KLA / TENCOR P-2's features combine to provide a reliable and comprehensive wafer testing and metrology tool that can provide accurate results for any application. With its innovative design and advanced technology, it is an invaluable tool for wafer analysis and failure analysis.
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