Used KLA / TENCOR P2 #9216047 for sale

KLA / TENCOR P2 is a wafer testing and metrology equipment designed to meet the challenges of metrology analysis for semiconductor production. It combines advanced wafer inspection and metrology capabilities into a single system to save both time and resources. The unit boasts several unique features designed to make a complex process more efficient. The highly advanced KLA P-2 uses advanced imaging capabilities to provide precise etch, texture, and overlay measurements. The machine can detect defects on the order of 0.5 microns, with the ability to autofocus on any sample and its full-field optically captured data. Additionally, TENCOR P 2 features an optional line scanner to capture a complete data set of the full wafer surface, giving the user complete control of wafer metrology. TENCOR P-2 also has a range of customization options. It can be set up for full-field or line scanning imaging, depending on the unique application requirements. The scanner can even be configured to capture thermal images, allowing it to perform temperature-sensitive processes more efficiently. The user interface of TENCOR P2 is designed to be easy to use, providing quick access to menus and functions. The tool is equipped with a self-contained analysis library, but can also be customized for use with third-party software or MAS Scripting. Furthermore, the asset can be programmed to detect and correct defects on the fly, improving the quality and yield of wafers. KLA P 2 is designed to meet the demands of an intensive wafer production process, ensuring that each wafer is produced to high standards of quality. Thanks to its advanced imaging capabilities, efficient user interface, and range of customization options, the model is able to quickly and accurately identify and correct defects, making wafer production faster and more cost-effective.